Evanescent-wave cavity ring-down ellipsometry

Michael A. Everest, Vassilis M. Papadakis, Katerina Stamataki, Stelios Tzortzakis, Benoit Loppinet, T. Peter Rakitzis

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8 Citations (Scopus)

Abstract

We introduce the new technique of evanescent-wave cavity ring-down ellipsometry (EW-CRDE), used for the measurement of ellipsometric angles of samples at a solid-gas or solid-liquid interface, and achieve phase-shift measurements with precision of ∼0.01°. We demonstrate the technique by measuring the time-dependent refractive index of methanol-water mixtures and thin films at the liquid/fused-silica interface, showing that the monitoring of monolayers on microsecond time scales using EW-CRDE should be achievable.

Original languageEnglish
Pages (from-to)1324-1327
Number of pages4
JournalJournal of Physical Chemistry Letters
Volume2
Issue number11
DOIs
Publication statusPublished - 2 Jun 2011

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ASJC Scopus subject areas

  • Materials Science(all)
  • Physical and Theoretical Chemistry

Cite this

Everest, M. A., Papadakis, V. M., Stamataki, K., Tzortzakis, S., Loppinet, B., & Rakitzis, T. P. (2011). Evanescent-wave cavity ring-down ellipsometry. Journal of Physical Chemistry Letters, 2(11), 1324-1327. https://doi.org/10.1021/jz200515d