Electron emission holography of small clusters and surfaces

S. Thevuthasan, G. S. Herman, A. P. Kaduwela, T. T. Tran, Y. J. Kim, R. S. Saiki, C. S. Fadley, M. A. Van Hove

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

We consider the three-dimensional imaging of near-surface structures by holographic transformations of large-solid-angle electron emission data sets. Results are presented for both single and multiple scattering theoretical simulations and experimental data which have been obtained for both the c(2x2) structure of S on Ni(001) and clean Si(111). Although features associated with near-neighbor atoms are seen in Fourier-transform images for all of the cases studied, these peaks show shifts of 0.30-1.5 A, as well as broadening and artifacts, that are primarily due to strong forward peaking and phase shifts in the electron-atom scattering. We further discuss correcting these image aberrations by several methods such as eliminating the forward peaking by a reduction of the data set or multiplication by a suitable Gaussian function, using the scattered-wave-included Fourier transform method, and taking a phased summation of several transforms at different energies. All of these correction methods are found to improve image quality in one or more aspects, and thus to show promise for future studies.

Original languageEnglish
Pages (from-to)2261-2270
Number of pages10
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume10
Issue number4
DOIs
Publication statusPublished - 1992
Externally publishedYes

Fingerprint

Electron emission
Holography
holography
electron emission
Fourier transforms
Atoms
Multiple scattering
Aberrations
Phase shift
Surface structure
Image quality
shift
Scattering
scattering
Imaging techniques
multiplication
atoms
artifacts
Electrons
aberration

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

Thevuthasan, S., Herman, G. S., Kaduwela, A. P., Tran, T. T., Kim, Y. J., Saiki, R. S., ... Van Hove, M. A. (1992). Electron emission holography of small clusters and surfaces. Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 10(4), 2261-2270. https://doi.org/10.1116/1.577928

Electron emission holography of small clusters and surfaces. / Thevuthasan, S.; Herman, G. S.; Kaduwela, A. P.; Tran, T. T.; Kim, Y. J.; Saiki, R. S.; Fadley, C. S.; Van Hove, M. A.

In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 10, No. 4, 1992, p. 2261-2270.

Research output: Contribution to journalArticle

Thevuthasan, S, Herman, GS, Kaduwela, AP, Tran, TT, Kim, YJ, Saiki, RS, Fadley, CS & Van Hove, MA 1992, 'Electron emission holography of small clusters and surfaces', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, vol. 10, no. 4, pp. 2261-2270. https://doi.org/10.1116/1.577928
Thevuthasan, S. ; Herman, G. S. ; Kaduwela, A. P. ; Tran, T. T. ; Kim, Y. J. ; Saiki, R. S. ; Fadley, C. S. ; Van Hove, M. A. / Electron emission holography of small clusters and surfaces. In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 1992 ; Vol. 10, No. 4. pp. 2261-2270.
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