Electron beam induced current at a Schottky nanocontact

M. Ledra, Nouar Tabet

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The electron beam induced current (EBIC) collection efficiency η of a circular nano Schottky contact of radius rc perpendicular to the electron beam was simulated using a Monte Carlo (MC) algorithm. The EBIC was obtained by simulating the random diffusion and collection of the minority carriers that are generated at point-like sources Si randomly distributed within the generation volume. The profile of the EBIC collection versus the distance to the nanocontact is simulated for two extreme values of the free surface recombination velocity vs (vs=0 and vs=∞) . The dependence of the maximum value of the collection efficiency ηmax, obtained as the electron beam impinges the surface at the centre of the nanocontact, was simulated as a function of radius rc. In addition, the variation of ηmax versus the incident beam energy was obtained.

Original languageEnglish
Pages (from-to)307-312
Number of pages6
JournalInternational Journal of Nano and Biomaterials
Volume2
Issue number1-5
DOIs
Publication statusPublished - 1 Dec 2009
Externally publishedYes

Fingerprint

Induced currents
Electron beams
electron beams
radii
minority carriers
point sources
electric contacts
profiles
energy

Keywords

  • Collection efficiency
  • EBIC
  • Electron beam induced current
  • Monte Carlo simulation
  • Nanocontact

ASJC Scopus subject areas

  • Biomaterials
  • Physical and Theoretical Chemistry
  • Biomedical Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

Electron beam induced current at a Schottky nanocontact. / Ledra, M.; Tabet, Nouar.

In: International Journal of Nano and Biomaterials, Vol. 2, No. 1-5, 01.12.2009, p. 307-312.

Research output: Contribution to journalArticle

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