Electrodeposition and characterization of CdSexTe1-x semiconducting thin films

E. Benamar, M. Rami, M. Fahoume, F. Chraibi, A. Ennaoui

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12 Citations (Scopus)


Thin polycrystalline films of cadmium chalcogenides CdSexTe1-x (0≤ × ≤ 1) have been prepared by electrochemical plating on ITO (indium tin oxide) coated glass substrates from an acid sulfate solution at 90°C. Structural, morphological and compositional studies of the deposited films are reported as a function of the x coefficient. XRD analysis shows that all deposits have a cubic structure with a preferred orientation along the (111) direction. The composition in the films is found to vary linearly with the composition in the solution. The increase in the selenium content x in the CdSexTe1-x films decreases the lattice constant and increases the band gap. Nevertheless this latter presents a minimum for x = 0.27.

Original languageEnglish
Pages (from-to)301-310
Number of pages10
JournalSolid State Sciences
Issue number5
Publication statusPublished - Jul 1999
Externally publishedYes


ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

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