Electrical and structural properties of La(Fe,M)O3 (M = Mn, Ni, Cu)

X. D. Zhou, Q. Cai, J. Yang, B. Scarfino, Y. Shin, W. James, W. B. Yelon, H. U. Anderson, L. R. Pederson

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Structural and electrical properties of doped LaFeO3 with Mn, Ni or Cu are studied by neutron diffraction, x-ray diffraction, conductivity measurements and thermoelectrical power measurements. Generation of the carriers (electron holes) in Mn and Cu doped LaFeO3 is a thermally activated process. The carrier fraction reaches a plateau determined by the dopant content. Electrical conductivity of Ni doped LaFeO3 is particularly high with a negligible activation energy, indicating Ni doped LaFeO3 is a metallic conductor, whereas conduction in Mn and Cu doped LaFeO3 is through polaron hopping. copyright The Electrochemical Society.

    Original languageEnglish
    Title of host publicationSolid State Ionic Devices IV
    Pages211-218
    Number of pages8
    Edition7
    DOIs
    Publication statusPublished - 1 Dec 2005
    Event4th International Symposium on Solid-State Ionic Devices - 208th Meeting of the Electrochemical Society - Los Angeles, CA, United States
    Duration: 16 Oct 200521 Oct 2005

    Publication series

    NameECS Transactions
    Number7
    Volume1
    ISSN (Print)1938-5862
    ISSN (Electronic)1938-6737

    Conference

    Conference4th International Symposium on Solid-State Ionic Devices - 208th Meeting of the Electrochemical Society
    CountryUnited States
    CityLos Angeles, CA
    Period16/10/0521/10/05

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    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Zhou, X. D., Cai, Q., Yang, J., Scarfino, B., Shin, Y., James, W., Yelon, W. B., Anderson, H. U., & Pederson, L. R. (2005). Electrical and structural properties of La(Fe,M)O3 (M = Mn, Ni, Cu). In Solid State Ionic Devices IV (7 ed., pp. 211-218). (ECS Transactions; Vol. 1, No. 7). https://doi.org/10.1149/1.2215556