Effect of non uniform out-of-plane illumination and shear rate on the accuracy of nPIV velocity measurements

Rana G. Khader, Reza Sadr

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Nano-particle image velocimetry (nPIV) uses evanescentwave illumination to measure two velocity components, U and V, tangent to the wall in a region with thickness of order of hundred nano meters. In this region the illumination intensity decays exponentially with distance normal to the wall, z, and hence tracers closer to the wall have "brighter" and "bigger" images than those that are further away, i.e. at larger z. Moreover fluid velocity varies in this region with z and hence tracers at different distance from the wall move at different speeds. Furthermore, Brownian displacement of particle tracers in this region is comparable to the displacement due to the fluid convection. The variation in the displacement of particle images in this region, with different brightness and velocities, can bias the near-wall velocities obtained using standard correlation based PIV method. Artificial nPIV images of nano particle in a flow field with linear out of plane velocity profile were used in this work to investigate the impact of these issues upon the accuracy of nPIV data. Uniform and Gaussian random distribution noise were added to the images to simulate electronic noise and shot noise, respectively. The artificial images were obtained and processed for various experimental parameters to incorporate different illumination profile and shear rates. The results demonstrate that non-uniform illumination affects the bias in the estimated tracer velocity for the shear flow. Non-uniform intensity also affects the bias due to Brownian diffusion; however, correction for Brownian diffusion can reduce this bias error.

Original languageEnglish
Title of host publicationASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, ICNMM2010
Pages681-689
Number of pages9
EditionPARTS A AND B
DOIs
Publication statusPublished - 2010
EventASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels, ICNMM2010 Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting - Montreal, QC
Duration: 1 Aug 20105 Aug 2010

Other

OtherASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels, ICNMM2010 Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting
CityMontreal, QC
Period1/8/105/8/10

Fingerprint

Velocity measurement
Shear deformation
Lighting
Shot noise
Fluids
Shear flow
Luminance
Flow fields

ASJC Scopus subject areas

  • Fluid Flow and Transfer Processes

Cite this

Khader, R. G., & Sadr, R. (2010). Effect of non uniform out-of-plane illumination and shear rate on the accuracy of nPIV velocity measurements. In ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, ICNMM2010 (PARTS A AND B ed., pp. 681-689) https://doi.org/10.1115/FEDSM-ICNMM2010-30567

Effect of non uniform out-of-plane illumination and shear rate on the accuracy of nPIV velocity measurements. / Khader, Rana G.; Sadr, Reza.

ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, ICNMM2010. PARTS A AND B. ed. 2010. p. 681-689.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Khader, RG & Sadr, R 2010, Effect of non uniform out-of-plane illumination and shear rate on the accuracy of nPIV velocity measurements. in ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, ICNMM2010. PARTS A AND B edn, pp. 681-689, ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels, ICNMM2010 Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, Montreal, QC, 1/8/10. https://doi.org/10.1115/FEDSM-ICNMM2010-30567
Khader RG, Sadr R. Effect of non uniform out-of-plane illumination and shear rate on the accuracy of nPIV velocity measurements. In ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, ICNMM2010. PARTS A AND B ed. 2010. p. 681-689 https://doi.org/10.1115/FEDSM-ICNMM2010-30567
Khader, Rana G. ; Sadr, Reza. / Effect of non uniform out-of-plane illumination and shear rate on the accuracy of nPIV velocity measurements. ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, ICNMM2010. PARTS A AND B. ed. 2010. pp. 681-689
@inproceedings{4940e07273054d4cbbc0c2ba940070c6,
title = "Effect of non uniform out-of-plane illumination and shear rate on the accuracy of nPIV velocity measurements",
abstract = "Nano-particle image velocimetry (nPIV) uses evanescentwave illumination to measure two velocity components, U and V, tangent to the wall in a region with thickness of order of hundred nano meters. In this region the illumination intensity decays exponentially with distance normal to the wall, z, and hence tracers closer to the wall have {"}brighter{"} and {"}bigger{"} images than those that are further away, i.e. at larger z. Moreover fluid velocity varies in this region with z and hence tracers at different distance from the wall move at different speeds. Furthermore, Brownian displacement of particle tracers in this region is comparable to the displacement due to the fluid convection. The variation in the displacement of particle images in this region, with different brightness and velocities, can bias the near-wall velocities obtained using standard correlation based PIV method. Artificial nPIV images of nano particle in a flow field with linear out of plane velocity profile were used in this work to investigate the impact of these issues upon the accuracy of nPIV data. Uniform and Gaussian random distribution noise were added to the images to simulate electronic noise and shot noise, respectively. The artificial images were obtained and processed for various experimental parameters to incorporate different illumination profile and shear rates. The results demonstrate that non-uniform illumination affects the bias in the estimated tracer velocity for the shear flow. Non-uniform intensity also affects the bias due to Brownian diffusion; however, correction for Brownian diffusion can reduce this bias error.",
author = "Khader, {Rana G.} and Reza Sadr",
year = "2010",
doi = "10.1115/FEDSM-ICNMM2010-30567",
language = "English",
isbn = "9780791854501",
pages = "681--689",
booktitle = "ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, ICNMM2010",
edition = "PARTS A AND B",

}

TY - GEN

T1 - Effect of non uniform out-of-plane illumination and shear rate on the accuracy of nPIV velocity measurements

AU - Khader, Rana G.

AU - Sadr, Reza

PY - 2010

Y1 - 2010

N2 - Nano-particle image velocimetry (nPIV) uses evanescentwave illumination to measure two velocity components, U and V, tangent to the wall in a region with thickness of order of hundred nano meters. In this region the illumination intensity decays exponentially with distance normal to the wall, z, and hence tracers closer to the wall have "brighter" and "bigger" images than those that are further away, i.e. at larger z. Moreover fluid velocity varies in this region with z and hence tracers at different distance from the wall move at different speeds. Furthermore, Brownian displacement of particle tracers in this region is comparable to the displacement due to the fluid convection. The variation in the displacement of particle images in this region, with different brightness and velocities, can bias the near-wall velocities obtained using standard correlation based PIV method. Artificial nPIV images of nano particle in a flow field with linear out of plane velocity profile were used in this work to investigate the impact of these issues upon the accuracy of nPIV data. Uniform and Gaussian random distribution noise were added to the images to simulate electronic noise and shot noise, respectively. The artificial images were obtained and processed for various experimental parameters to incorporate different illumination profile and shear rates. The results demonstrate that non-uniform illumination affects the bias in the estimated tracer velocity for the shear flow. Non-uniform intensity also affects the bias due to Brownian diffusion; however, correction for Brownian diffusion can reduce this bias error.

AB - Nano-particle image velocimetry (nPIV) uses evanescentwave illumination to measure two velocity components, U and V, tangent to the wall in a region with thickness of order of hundred nano meters. In this region the illumination intensity decays exponentially with distance normal to the wall, z, and hence tracers closer to the wall have "brighter" and "bigger" images than those that are further away, i.e. at larger z. Moreover fluid velocity varies in this region with z and hence tracers at different distance from the wall move at different speeds. Furthermore, Brownian displacement of particle tracers in this region is comparable to the displacement due to the fluid convection. The variation in the displacement of particle images in this region, with different brightness and velocities, can bias the near-wall velocities obtained using standard correlation based PIV method. Artificial nPIV images of nano particle in a flow field with linear out of plane velocity profile were used in this work to investigate the impact of these issues upon the accuracy of nPIV data. Uniform and Gaussian random distribution noise were added to the images to simulate electronic noise and shot noise, respectively. The artificial images were obtained and processed for various experimental parameters to incorporate different illumination profile and shear rates. The results demonstrate that non-uniform illumination affects the bias in the estimated tracer velocity for the shear flow. Non-uniform intensity also affects the bias due to Brownian diffusion; however, correction for Brownian diffusion can reduce this bias error.

UR - http://www.scopus.com/inward/record.url?scp=84856006197&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84856006197&partnerID=8YFLogxK

U2 - 10.1115/FEDSM-ICNMM2010-30567

DO - 10.1115/FEDSM-ICNMM2010-30567

M3 - Conference contribution

SN - 9780791854501

SP - 681

EP - 689

BT - ASME 2010 8th International Conference on Nanochannels, Microchannels, and Minichannels Collocated with 3rd Joint US-European Fluids Engineering Summer Meeting, ICNMM2010

ER -