Dynamic range enhancing technique for form, waviness and roughness measurements using fringe projection

Ayman Samara, Faramarz Farahi, Angela Davies

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Optical techniques are used for non contact, high precision measurement tools. The most common optical technique is classical laser interferometry. Although laser interferometers offer high resolution, they suffer from limited dynamic range since the range is related to the wavelength of light. Other optical techniques like scanning white light interferometry and holography overcome this limitation. In this paper we propose a technique to enhance the vertical measurement range of a fringe projection system without reduction in its vertical resolution. It is based on the principle of inverse fringe projection, where the surface form is first measured by projecting a low frequency straight grating, and then used to create high frequency fringes with the proper inverse profile to project back on the surface and measure the surface finish without the impact of the form. The proposed technique is modeled, simulated and tested to measure the form, waviness and roughness of surfaces.

Original languageEnglish
Article number58790F
Pages (from-to)1-12
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5879
DOIs
Publication statusPublished - 2005
Externally publishedYes

Fingerprint

Fringe Projection
Roughness measurement
Dynamic Range
Roughness
dynamic range
roughness
projection
Laser interferometry
Projection systems
laser interferometry
Vertical
Laser Interferometry
White Light Interferometry
Holography
rangefinding
Laser Interferometer
Interferometry
holography
Interferometers
Non-contact

Keywords

  • Fringe projection
  • Interferometry
  • Optical instruments
  • Surface finish
  • Surface metrology

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Dynamic range enhancing technique for form, waviness and roughness measurements using fringe projection. / Samara, Ayman; Farahi, Faramarz; Davies, Angela.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 5879, 58790F, 2005, p. 1-12.

Research output: Contribution to journalArticle

@article{9bc52249cf72414ea2dff0f1fd24845f,
title = "Dynamic range enhancing technique for form, waviness and roughness measurements using fringe projection",
abstract = "Optical techniques are used for non contact, high precision measurement tools. The most common optical technique is classical laser interferometry. Although laser interferometers offer high resolution, they suffer from limited dynamic range since the range is related to the wavelength of light. Other optical techniques like scanning white light interferometry and holography overcome this limitation. In this paper we propose a technique to enhance the vertical measurement range of a fringe projection system without reduction in its vertical resolution. It is based on the principle of inverse fringe projection, where the surface form is first measured by projecting a low frequency straight grating, and then used to create high frequency fringes with the proper inverse profile to project back on the surface and measure the surface finish without the impact of the form. The proposed technique is modeled, simulated and tested to measure the form, waviness and roughness of surfaces.",
keywords = "Fringe projection, Interferometry, Optical instruments, Surface finish, Surface metrology",
author = "Ayman Samara and Faramarz Farahi and Angela Davies",
year = "2005",
doi = "10.1117/12.614547",
language = "English",
volume = "5879",
pages = "1--12",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

TY - JOUR

T1 - Dynamic range enhancing technique for form, waviness and roughness measurements using fringe projection

AU - Samara, Ayman

AU - Farahi, Faramarz

AU - Davies, Angela

PY - 2005

Y1 - 2005

N2 - Optical techniques are used for non contact, high precision measurement tools. The most common optical technique is classical laser interferometry. Although laser interferometers offer high resolution, they suffer from limited dynamic range since the range is related to the wavelength of light. Other optical techniques like scanning white light interferometry and holography overcome this limitation. In this paper we propose a technique to enhance the vertical measurement range of a fringe projection system without reduction in its vertical resolution. It is based on the principle of inverse fringe projection, where the surface form is first measured by projecting a low frequency straight grating, and then used to create high frequency fringes with the proper inverse profile to project back on the surface and measure the surface finish without the impact of the form. The proposed technique is modeled, simulated and tested to measure the form, waviness and roughness of surfaces.

AB - Optical techniques are used for non contact, high precision measurement tools. The most common optical technique is classical laser interferometry. Although laser interferometers offer high resolution, they suffer from limited dynamic range since the range is related to the wavelength of light. Other optical techniques like scanning white light interferometry and holography overcome this limitation. In this paper we propose a technique to enhance the vertical measurement range of a fringe projection system without reduction in its vertical resolution. It is based on the principle of inverse fringe projection, where the surface form is first measured by projecting a low frequency straight grating, and then used to create high frequency fringes with the proper inverse profile to project back on the surface and measure the surface finish without the impact of the form. The proposed technique is modeled, simulated and tested to measure the form, waviness and roughness of surfaces.

KW - Fringe projection

KW - Interferometry

KW - Optical instruments

KW - Surface finish

KW - Surface metrology

UR - http://www.scopus.com/inward/record.url?scp=29244441422&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=29244441422&partnerID=8YFLogxK

U2 - 10.1117/12.614547

DO - 10.1117/12.614547

M3 - Article

VL - 5879

SP - 1

EP - 12

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

M1 - 58790F

ER -