Drift invariant gas recognition technique for on chip Tin oxide gas sensor array

F. Flitti, A. Far, B. Guo, A. Bermak

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The purpose of this paper is the study of the robustness of a new low complexity recognition method based on the measurement issued from an on chip 4 × 4 Tin oxide gas sensor array. The recognition system is based on a vector angle similarity measure between the query gas and the representatives of the different gas classes. The latter are obtained using a clustering algorithm based on the same measure within the training data set. Experimented results show more than 98% of good recognition and the robustness of the proposed approach is tested by recognizing gas measurements with simulated drift. Less than 1% of performance degradation is noted at the worst case.

Original languageEnglish
Title of host publicationProceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
Pages421-424
Number of pages4
DOIs
Publication statusPublished - 5 Sep 2008
Event4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008 - Hong Kong, SAR, Hong Kong
Duration: 23 Jan 200825 Jan 2008

Publication series

NameProceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008

Other

Other4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
CountryHong Kong
CityHong Kong, SAR
Period23/1/0825/1/08

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ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Flitti, F., Far, A., Guo, B., & Bermak, A. (2008). Drift invariant gas recognition technique for on chip Tin oxide gas sensor array. In Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008 (pp. 421-424). [4459584] (Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008). https://doi.org/10.1109/DELTA.2008.24