Distortion of the oxygen sublattice in pure cubic-ZrO2

C. M. Wang, S. Azad, S. Thevuthasan, V. Shutthanandan, D. E. McCready, C. H.F. Peden

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    Multilayer films of pure ZrO2 and CeO2 were grown using molecular beam epitaxy on a yttria-stabilized zirconia (YSZ) substrate. Distinctive forbidden diffraction spots of (odd, odd, even) type were observed on the selected-area electron-diffraction patterns of the film. Dark-field imaging clearly revealed that these forbidden diffraction spots were solely due to the ZrO2 layers. Comparison of the electron diffraction pattern with that simulated by dynamical calculations suggest that the pure ZrO2 layers possess a cubic structure of space with the group P4̄ 3m oxygen sublattice being displaced diagonally, rather than along the c axis as suggested for YSZ. Our results further suggest that the displacement of the oxygen from the ideal (1/4, 1/4, 1/4) position might have been introduced during the film growth process.

    Original languageEnglish
    Pages (from-to)1315-1319
    Number of pages5
    JournalJournal of Materials Research
    Issue number5
    Publication statusPublished - 1 May 2004


    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

    Cite this

    Wang, C. M., Azad, S., Thevuthasan, S., Shutthanandan, V., McCready, D. E., & Peden, C. H. F. (2004). Distortion of the oxygen sublattice in pure cubic-ZrO2. Journal of Materials Research, 19(5), 1315-1319. https://doi.org/10.1557/JMR.2004.0175