Crystallinity and magnetoresistance in La1-xCaxMnO3 thin films

E. S. Gilman, M. Li, K. H. Dahmen

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The crystallinity of La1-xCaxMnO3 (LCMO) thin films can be controlled by preparing the films on substrates with different lattice parameters. Closely lattice matched LCMO thin films on LaAlO3 (LAO) substrates exhibit a high degree of crystallinity and have magnetoresistance (MR) and MR ratio [R(H=0 T)·R(H=6 T)]/R(H=6 T) that is sharply peaked in the vicinity of the metal-insulator transition temperature (TMI). Notably, films grown on LAO(011) have TMI shifted up in temperature ∼20 K higher than the same films on LAO(011) substrates. LCMO films on Al2O3 and Y-ZrO2, that are not as closely lattice matched, have a lower degree of crystallinity, less sharply peaked MR and a nearly constant MR ratio below TMI over a broad temperature range.

Original languageEnglish
Pages (from-to)6217-6220
Number of pages4
JournalJournal of Applied Physics
Volume84
Issue number11
Publication statusPublished - 1 Dec 1998
Externally publishedYes

    Fingerprint

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Gilman, E. S., Li, M., & Dahmen, K. H. (1998). Crystallinity and magnetoresistance in La1-xCaxMnO3 thin films. Journal of Applied Physics, 84(11), 6217-6220.