Comparison of reconstructed spatial microstructure images using different statistical descriptors

D. S. Li, M. A. Tschopp, M. Khaleel, X. Sun

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

The objective of this research is to examine the use of statistical descriptors in the microstructure reconstruction process and the associated effect on microstructure properties. In this work, two-point correlation functions and lineal path functions were used to study the efficiency and accuracy of microstructure reconstruction. A polar plot of the two-point correlation functions is used to quantitatively evaluate the agreement with the target microstructure. In general, as more microstructure descriptors are added for the microstructure reconstruction process, the computational time increases and the reconstructed microstructures quantitatively agree better with the target microstructure. However, in some cases, adding lineal path functions did not always result in a better microstructural representation. Last, finite element analysis of thermal loading in the reconstructed microstructures of loaded nuclear waste glass is used to evaluate the property predictions with those of the target microstructure. Identifying which statistical descriptors are best for different microstructures may provide insight into optimizing the microstructure reconstruction process from limited statistical descriptors.

Original languageEnglish
Pages (from-to)437-444
Number of pages8
JournalComputational Materials Science
Volume51
Issue number1
DOIs
Publication statusPublished - 1 Jan 2012
Externally publishedYes

Fingerprint

Descriptors
Microstructure
microstructure
Target
Correlation Function
Radioactive Waste
Path
Evaluate
radioactive wastes
Radioactive wastes
plots
Finite Element
Finite element method
Glass
glass
Prediction

Keywords

  • Lineal path function
  • Microstructure reconstruction
  • Statistical correlation
  • Two-point correlation function

ASJC Scopus subject areas

  • Materials Science(all)
  • Chemistry(all)
  • Computer Science(all)
  • Physics and Astronomy(all)
  • Computational Mathematics
  • Mechanics of Materials

Cite this

Comparison of reconstructed spatial microstructure images using different statistical descriptors. / Li, D. S.; Tschopp, M. A.; Khaleel, M.; Sun, X.

In: Computational Materials Science, Vol. 51, No. 1, 01.01.2012, p. 437-444.

Research output: Contribution to journalArticle

Li, D. S. ; Tschopp, M. A. ; Khaleel, M. ; Sun, X. / Comparison of reconstructed spatial microstructure images using different statistical descriptors. In: Computational Materials Science. 2012 ; Vol. 51, No. 1. pp. 437-444.
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