Circular dichroism in the angular distribution of core photoelectrons from Si(001)

A photoelectron-diffraction analysis

A. P. Kaduwela, H. Xiao, S. Thevuthasan, C. S. Fadley, M. A. Van Hove

Research output: Contribution to journalArticle

31 Citations (Scopus)

Abstract

Circular dichroism has by now been observed experimentally in the angular distributions of core photoelectrons from both adsorbed molecules and atoms in single-crystal substrates. Photoelectron-diffraction theory provides a general method for predicting and analyzing such effects, as we demonstrate here by applying it to such dichroism in a nonmagnetic single crystal: Si 2s and 2p emission from Si(001), as studied experimentally by Daimon et al. [Jpn. J. Appl. Phys. 32, L1480 (1993)]. Our calculations correctly predict the apparent rotation of certain major diffraction features with right and left circularly polarized light, and also provide a more quantitative approach to analyzing such data than a previously proposed model based upon considerations of forward-scattering effects in photoelectron excitation.

Original languageEnglish
Pages (from-to)14927-14934
Number of pages8
JournalPhysical Review B
Volume52
Issue number20
DOIs
Publication statusPublished - 1995
Externally publishedYes

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Angular distribution
Dichroism
Photoelectrons
dichroism
photoelectrons
angular distribution
Diffraction
diffraction
Single crystals
Forward scattering
single crystals
forward scattering
Light polarization
polarized light
Atoms
Molecules
Substrates
excitation
atoms
molecules

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Circular dichroism in the angular distribution of core photoelectrons from Si(001) : A photoelectron-diffraction analysis. / Kaduwela, A. P.; Xiao, H.; Thevuthasan, S.; Fadley, C. S.; Van Hove, M. A.

In: Physical Review B, Vol. 52, No. 20, 1995, p. 14927-14934.

Research output: Contribution to journalArticle

Kaduwela, A. P. ; Xiao, H. ; Thevuthasan, S. ; Fadley, C. S. ; Van Hove, M. A. / Circular dichroism in the angular distribution of core photoelectrons from Si(001) : A photoelectron-diffraction analysis. In: Physical Review B. 1995 ; Vol. 52, No. 20. pp. 14927-14934.
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