CHARACTERIZATION OF POLYCRYSTALLINE GERMANIUM BY EBIC.

Nouar Tabet, Claude Monty

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The electron-beam-induced-current (EBIC) mode of a scanning electron microscope has been used to characterize the electrical activity of the grain boundaries in germanium. The boundaries have been characterized from a structural point of view using electron channeling patterns (ECP) and X-ray topography. The low-angle boundaries in Ge polycrystals show an EBIC contrast C which increases when the beam energy increases, while the SIGMA 3 twins do not show a significant activity even when there is a deviation from the coincidence orientation. The collection eficiency of eta of Schottky contacts has been measured. Both C and eta measurements cannot be quantitatively analyzed using previously existing models. The basic ideas which should lead to a better modeling are discussed.

Original languageEnglish
Pages (from-to)763-776
Number of pages14
JournalPhilosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties
Volume57
Issue number6
Publication statusPublished - 1 Jun 1988
Externally publishedYes

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Induced currents
Germanium
Electron beams
Polycrystals
Topography
Grain boundaries
Electron microscopes
Scanning
X rays
Electrons

ASJC Scopus subject areas

  • Engineering(all)

Cite this

CHARACTERIZATION OF POLYCRYSTALLINE GERMANIUM BY EBIC. / Tabet, Nouar; Monty, Claude.

In: Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties, Vol. 57, No. 6, 01.06.1988, p. 763-776.

Research output: Contribution to journalArticle

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