Characterization of polycrystalline germanium by EBIC

Nouar Tabet, Claude Monty

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Abstract

The electron-beam-induced-current (EBIC) mode of a scanning electron microscope has been used to characterize the electrical activity of the grain boundaries in germanium. The boundaries have also been characterized from a structural point of view using electron channelling patterns (ECP) and X-ray topography. The low-angle boundaries in Ge polycrystals show an EBIC contrast C which increases when the beam energy increases, while the ∑3 twins do not show a significant activity even when there is a deviation from the coincidence orientation. The collection efficiency η of Schottky contacts has been measured. Both C and η measurements cannot be quantitatively analysed using previously existing models. The basic ideas which should lead to a better modelling are discussed.

Original languageEnglish
Pages (from-to)763-776
Number of pages14
JournalPhilosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
Volume57
Issue number6
DOIs
Publication statusPublished - Jun 1988

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ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Physics and Astronomy(all)

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