Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy

R. Tenne, E. Galun, A. Ennaoui, S. Fiechter, K. Ellmer, M. Kunst, Ch Koelzow, Ch Pettenkofer, S. Tiefenbacher, R. Scheer, H. Jungblut, W. Jaegermann

Research output: Contribution to journal › Article

18 Citations (Scopus)

Abstract

WSe2 films (1-4 μm thick) prepared over a molten NixSey substrate (by the so-called van der Waals rheotaxy process) at elevated temperatures, where characterized through a number of techniques. They were shown to possess very good optical and electronic properties, in addition to having (almost) perfect type-II texture, i.e. c axis perpendicular to the substrate. Ramifications of this work to photovoltaics and solid lubrication, is briefly discussed.

Original languageEnglish
Pages (from-to)38-42
Number of pages5
JournalThin Solid Films
Volume272
Issue number1
DOIs
Publication statusPublished - 1 Jan 1996
Externally publishedYes

Fingerprint

Thin films
Substrates
lubrication
thin films
Electronic properties
Lubrication
Molten materials
textures
Optical properties
Textures
optical properties
electronics
Temperature
temperature

Keywords

  • Optical properties
  • Photovoltage
  • Selenides
  • Tungsten

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Tenne, R., Galun, E., Ennaoui, A., Fiechter, S., Ellmer, K., Kunst, M., ... Jaegermann, W. (1996). Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy. Thin Solid Films, 272(1), 38-42. https://doi.org/10.1016/0040-6090(95)06963-1

Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy. / Tenne, R.; Galun, E.; Ennaoui, A.; Fiechter, S.; Ellmer, K.; Kunst, M.; Koelzow, Ch; Pettenkofer, Ch; Tiefenbacher, S.; Scheer, R.; Jungblut, H.; Jaegermann, W.

In: Thin Solid Films, Vol. 272, No. 1, 01.01.1996, p. 38-42.

Research output: Contribution to journal › Article

Tenne, R, Galun, E, Ennaoui, A, Fiechter, S, Ellmer, K, Kunst, M, Koelzow, C, Pettenkofer, C, Tiefenbacher, S, Scheer, R, Jungblut, H & Jaegermann, W 1996, 'Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy', Thin Solid Films, vol. 272, no. 1, pp. 38-42. https://doi.org/10.1016/0040-6090(95)06963-1
Tenne R, Galun E, Ennaoui A, Fiechter S, Ellmer K, Kunst M et al. Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy. Thin Solid Films. 1996 Jan 1;272(1):38-42. https://doi.org/10.1016/0040-6090(95)06963-1
Tenne, R. ; Galun, E. ; Ennaoui, A. ; Fiechter, S. ; Ellmer, K. ; Kunst, M. ; Koelzow, Ch ; Pettenkofer, Ch ; Tiefenbacher, S. ; Scheer, R. ; Jungblut, H. ; Jaegermann, W. / Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy. In: Thin Solid Films. 1996 ; Vol. 272, No. 1. pp. 38-42.
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