CHAPTER 2: Scanning transmission electron microscopyy

A. R. Lupini, Sergey Rashkeev, M. Varela, A. Y. Borisevich, M. P. Oxley, K. Van Benthem, Y. Peng, N. De Jonge, G. M. Veith, T. J. Pennycook, W. Zhou, R. Ishikawa, M. F. Chisholm, S. T. Pantelides, S. J. Pennycook

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

The scanning transmission electron microscope (STEM) is one of the most useful tools in many areas of atomic-scale materials science and nanocharacterization. A STEM has the ability to generate local maps of the chemical composition and electronic structure at atomic resolution, even in complex or unknown samples. Here we describe the important components of a state-of-the-art aberration-corrected STEM and review the application of STEM imaging to a variety of published nanocharacterisation examples in catalysis and solid state materials problems.

Original languageEnglish
Title of host publicationHierarchical Nanostructures for Energy Devices
PublisherRoyal Society of Chemistry
Pages30-79
Number of pages50
Volume2015-January
Edition37
DOIs
Publication statusPublished - 2015

Publication series

NameRSC Nanoscience and Nanotechnology
Number37
Volume2015-January
ISSN (Print)17577136
ISSN (Electronic)17577144

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ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Bioengineering
  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

Cite this

Lupini, A. R., Rashkeev, S., Varela, M., Borisevich, A. Y., Oxley, M. P., Van Benthem, K., Peng, Y., De Jonge, N., Veith, G. M., Pennycook, T. J., Zhou, W., Ishikawa, R., Chisholm, M. F., Pantelides, S. T., & Pennycook, S. J. (2015). CHAPTER 2: Scanning transmission electron microscopyy. In Hierarchical Nanostructures for Energy Devices (37 ed., Vol. 2015-January, pp. 30-79). (RSC Nanoscience and Nanotechnology; Vol. 2015-January, No. 37). Royal Society of Chemistry. https://doi.org/10.1039/9781782621867-00030