Cathodoluminescence dependence on electron beam diameter

S. Achour, M. T. Benlahrache, A. Harabi, N. Tabet

Research output: Contribution to journalArticle


An interesting behaviour of the cathodoluminescence (CL) intensity as a function of electron beam spot size was found, i.e. the relative CL intensity of both edge and defect emissions in all semiconducting materials studied here depends strongly upon the electron beam diameter; while the defect emission increases, the edge emission always decreases with increasing spot size.

Original languageEnglish
Pages (from-to)141-143
Number of pages3
JournalMaterials Science and Engineering B
Issue number1-3
Publication statusPublished - May 1994


ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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