Basic principles of atomic force microscopy

Daniel Johnson, Nidal Hilal, W. Richard Bowen

Research output: Chapter in Book/Report/Conference proceedingChapter

11 Citations (Scopus)

Abstract

This chapter presents basic principles of operation of an atomic force microscope (AFM) that outlines the most common imaging modes and describes the acquisition of force distance measurements and techniques to calibrate cantilever spring constants. The AFM, also referred to as the scanning force microscope (SFM), is a part of a larger family of instruments termed as the scanning probe microscopes. These also include the scanning tunneling microscope (STM) and scanning near field optical microscope (SNOM), among others. The common factor in all SPM techniques is the use of a very sharp probe, which is scanned across a surface of interest, with the interactions between the probe and the surface being used to produce a very high resolution image of the sample, potentially to the subnanometer scale, depending upon the technique and sharpness of the probe tip. The AFM was first described as a new technique for imaging the topography of surfaces to a high resolution. It was created as a solution to the limitations of the STM, which was able to image only conductive samples in vacuum. The AFM has a number of advantages over electron microscope techniques, primarily its versatility in being able to take measurements in air or fluid environments rather than in high vacuum, which allows the imaging of polymeric and biological samples in their native state. It is highly adaptable with probes being able to be chemically fictionalized to allow quantitative measurement of interactions between many different types of materials-a technique often referred to as chemical force microscopy. © 2009

Original languageEnglish
Title of host publicationAtomic Force Microscopy in Process Engineering
PublisherElsevier Ltd
Pages1-30
Number of pages30
ISBN (Print)9781856175173
DOIs
Publication statusPublished - 2009
Externally publishedYes

Fingerprint

microscopes
atomic force microscopy
scanning
probes
high resolution
sharpness
versatility
high vacuum
optical microscopes
acquisition
near fields
topography
electron microscopes
interactions
microscopy
vacuum
fluids
air

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Johnson, D., Hilal, N., & Bowen, W. R. (2009). Basic principles of atomic force microscopy. In Atomic Force Microscopy in Process Engineering (pp. 1-30). Elsevier Ltd. https://doi.org/10.1016/B978-1-85617-517-3.00001-8

Basic principles of atomic force microscopy. / Johnson, Daniel; Hilal, Nidal; Bowen, W. Richard.

Atomic Force Microscopy in Process Engineering. Elsevier Ltd, 2009. p. 1-30.

Research output: Chapter in Book/Report/Conference proceedingChapter

Johnson, D, Hilal, N & Bowen, WR 2009, Basic principles of atomic force microscopy. in Atomic Force Microscopy in Process Engineering. Elsevier Ltd, pp. 1-30. https://doi.org/10.1016/B978-1-85617-517-3.00001-8
Johnson D, Hilal N, Bowen WR. Basic principles of atomic force microscopy. In Atomic Force Microscopy in Process Engineering. Elsevier Ltd. 2009. p. 1-30 https://doi.org/10.1016/B978-1-85617-517-3.00001-8
Johnson, Daniel ; Hilal, Nidal ; Bowen, W. Richard. / Basic principles of atomic force microscopy. Atomic Force Microscopy in Process Engineering. Elsevier Ltd, 2009. pp. 1-30
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