Atomic imaging by x-ray-fluorescence holography and electron-emission holography: A comparative theoretical study

P. M. Len, S. Thevuthasan, C. S. Fadley, A. P. Kaduwela, M. A. Van Hove

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    Abstract

    We consider from a theoretical viewpoint the direct imaging of atoms at and near the surfaces of solids by both x-ray-fluorescence holography (XFH) and electron-emission holography (EEH). The more ideal nature of x-ray scattering makes XFH images superior to those in single-energy EEH. The overlap of real and twin features for pairs of atoms at ±a can cause their XFH or EEH atomic images to cancel for certain combinations of wave vector and a. The relative merits of XFH and EEH for structure studies are considered.

    Original languageEnglish
    Pages (from-to)11275-11278
    Number of pages4
    JournalPhysical Review B
    Volume50
    Issue number15
    DOIs
    Publication statusPublished - 1 Jan 1994

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    ASJC Scopus subject areas

    • Condensed Matter Physics

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