Architecture of a low storage digital pixel sensor array with an on-line block-based compression

Milin Zhang, Amine Bermak

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, a block-based architecture of digital pixel sensor (DPS) array integrated with an on-line compression algorithm is proposed. The proposed technique is based on a block divided storage and compression scheme of the original image. Image capture, storage, and reordering are completed simultaneously and performed on-line while storing pixel value into the on-chip memory array. More than 60% of memory saving is achieved using the proposed block-based design. Furthermore, block-based design greatly reduces the accumulation error inherent in DPCM type of processing. Simulation results show that the PSNR result can reach around 30dB with a compression ratio of less than 3BPP.

Original languageEnglish
Title of host publicationProceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
Pages167-170
Number of pages4
DOIs
Publication statusPublished - 5 Sep 2008
Event4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008 - Hong Kong, SAR, Hong Kong
Duration: 23 Jan 200825 Jan 2008

Publication series

NameProceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008

Other

Other4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
CountryHong Kong
CityHong Kong, SAR
Period23/1/0825/1/08

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Keywords

  • Block-based compression
  • DPS
  • Error propagation
  • Low storage

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Zhang, M., & Bermak, A. (2008). Architecture of a low storage digital pixel sensor array with an on-line block-based compression. In Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008 (pp. 167-170). [4459533] (Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008). https://doi.org/10.1109/DELTA.2008.117