An ontology-based integrated assessment framework for high-assurance systems

Raymond Paul, I. Ling Yen, Farokh Bastani, Jing Dong, Wei Tek Tsai, Krishna Kavi, Arif Ghafoor, Jaideep Srivastava

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

High assurance systems have evolving requirements and, hence, the definition for assurance requirements should allow evolution. We recommend the use of ontology to capture such evolving requirements. In this paper, we introduce the concept of trustworthiness to include dependability and some additional high assurance attributes. We develop an ontology of trustworthiness aspects and an ontology of system entities. Based on these ontologies, a framework for trustworthiness assessment is constructed. This framework supports systematic and well guided trustworthy assessment from the individual system entities to the overall integrated system. It also offers the potential for automated trustworthiness assessment.

Original languageEnglish
Title of host publicationProceedings - IEEE International Conference on Semantic Computing 2008, ICSC 2008
Pages386-393
Number of pages8
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event2nd Annual IEEE International Conference on Semantic Computing, ICSC 2008 - Santa Clara, CA
Duration: 4 Aug 20087 Aug 2008

Other

Other2nd Annual IEEE International Conference on Semantic Computing, ICSC 2008
CitySanta Clara, CA
Period4/8/087/8/08

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Ontology
Computer systems

ASJC Scopus subject areas

  • Artificial Intelligence
  • Software

Cite this

Paul, R., Yen, I. L., Bastani, F., Dong, J., Tsai, W. T., Kavi, K., ... Srivastava, J. (2008). An ontology-based integrated assessment framework for high-assurance systems. In Proceedings - IEEE International Conference on Semantic Computing 2008, ICSC 2008 (pp. 386-393). [4597216] https://doi.org/10.1109/ICSC.2008.46

An ontology-based integrated assessment framework for high-assurance systems. / Paul, Raymond; Yen, I. Ling; Bastani, Farokh; Dong, Jing; Tsai, Wei Tek; Kavi, Krishna; Ghafoor, Arif; Srivastava, Jaideep.

Proceedings - IEEE International Conference on Semantic Computing 2008, ICSC 2008. 2008. p. 386-393 4597216.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Paul, R, Yen, IL, Bastani, F, Dong, J, Tsai, WT, Kavi, K, Ghafoor, A & Srivastava, J 2008, An ontology-based integrated assessment framework for high-assurance systems. in Proceedings - IEEE International Conference on Semantic Computing 2008, ICSC 2008., 4597216, pp. 386-393, 2nd Annual IEEE International Conference on Semantic Computing, ICSC 2008, Santa Clara, CA, 4/8/08. https://doi.org/10.1109/ICSC.2008.46
Paul R, Yen IL, Bastani F, Dong J, Tsai WT, Kavi K et al. An ontology-based integrated assessment framework for high-assurance systems. In Proceedings - IEEE International Conference on Semantic Computing 2008, ICSC 2008. 2008. p. 386-393. 4597216 https://doi.org/10.1109/ICSC.2008.46
Paul, Raymond ; Yen, I. Ling ; Bastani, Farokh ; Dong, Jing ; Tsai, Wei Tek ; Kavi, Krishna ; Ghafoor, Arif ; Srivastava, Jaideep. / An ontology-based integrated assessment framework for high-assurance systems. Proceedings - IEEE International Conference on Semantic Computing 2008, ICSC 2008. 2008. pp. 386-393
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