An evanescent wave velocity measurement technique for microfluidic applications

D. Fourguette, M. Yoda, Reza Sadr, H. Li, D. Wilson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a technique based on integrated optics to generate an evanescent wave illumination at the surface of a waveguide. This evanescent wave illumination is used to make velocity measurements within the first 80 nanometers of the waveguide surface using Nano-Particle Velocimetry (nPIV).

Original languageEnglish
Title of host publicationICIASF'05 Record - 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005
Pages257-261
Number of pages5
Volume2005
Publication statusPublished - 2005
Externally publishedYes
Event21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005, ICIASF'05 - Sendai, Japan
Duration: 29 Aug 20051 Sep 2005

Other

Other21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005, ICIASF'05
CountryJapan
CitySendai
Period29/8/051/9/05

Fingerprint

evanescent waves
velocity measurement
Microfluidics
Velocity measurement
Waveguides
Lighting
illumination
waveguides
Integrated optics
integrated optics

ASJC Scopus subject areas

  • Aerospace Engineering
  • Condensed Matter Physics
  • Instrumentation

Cite this

Fourguette, D., Yoda, M., Sadr, R., Li, H., & Wilson, D. (2005). An evanescent wave velocity measurement technique for microfluidic applications. In ICIASF'05 Record - 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005 (Vol. 2005, pp. 257-261). [1569931]

An evanescent wave velocity measurement technique for microfluidic applications. / Fourguette, D.; Yoda, M.; Sadr, Reza; Li, H.; Wilson, D.

ICIASF'05 Record - 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005. Vol. 2005 2005. p. 257-261 1569931.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fourguette, D, Yoda, M, Sadr, R, Li, H & Wilson, D 2005, An evanescent wave velocity measurement technique for microfluidic applications. in ICIASF'05 Record - 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005. vol. 2005, 1569931, pp. 257-261, 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005, ICIASF'05, Sendai, Japan, 29/8/05.
Fourguette D, Yoda M, Sadr R, Li H, Wilson D. An evanescent wave velocity measurement technique for microfluidic applications. In ICIASF'05 Record - 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005. Vol. 2005. 2005. p. 257-261. 1569931
Fourguette, D. ; Yoda, M. ; Sadr, Reza ; Li, H. ; Wilson, D. / An evanescent wave velocity measurement technique for microfluidic applications. ICIASF'05 Record - 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005. Vol. 2005 2005. pp. 257-261
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