An evanescent wave velocity measurement technique for microfluidic applications

D. Fourguette, M. Yoda, R. Sadr, H. Li, D. Wilson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a technique based on integrated optics to generate an evanescent wave illumination at the surface of a waveguide. This evanescent wave illumination is used to make velocity measurements within the first 80 nanometers of the waveguide surface using Nano-Particle Velocimetry (nPIV).

Original languageEnglish
Title of host publicationICIASF'05 Record - 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005
Pages257-261
Number of pages5
Publication statusPublished - 1 Dec 2005
Event21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005, ICIASF'05 - Sendai, Japan
Duration: 29 Aug 20051 Sep 2005

Publication series

NameICIASF Record, International Congress on Instrumentation in Aerospace Simulation Facilities
Volume2005
ISSN (Print)0730-2010

Other

Other21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005, ICIASF'05
CountryJapan
CitySendai
Period29/8/051/9/05

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ASJC Scopus subject areas

  • Instrumentation
  • Aerospace Engineering
  • Condensed Matter Physics

Cite this

Fourguette, D., Yoda, M., Sadr, R., Li, H., & Wilson, D. (2005). An evanescent wave velocity measurement technique for microfluidic applications. In ICIASF'05 Record - 21st International Congress on Instrumentation in Aerospace Simulation Facilities, 2005 (pp. 257-261). [1569931] (ICIASF Record, International Congress on Instrumentation in Aerospace Simulation Facilities; Vol. 2005).