An active damping technique for a current source inverter employing a virtual negative inductance

Ahmed Salah Morsy, Shehab Ahmed, Prasad Enjeti, Ahmed Massoud

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

A grid connected CSI requires a CL filter stage. In this work, the isolation transformer leakage inductance constitutes this filter inductance. This CL filter is lightly damped for efficiency constraints. Hence, it is subject to resonance if excited by inverter current harmonics, pre-existing grid voltage harmonics, or due to step changes in power. Previous work on active damping employed a virtual resistance at high frequencies, including the resonance frequency. However, this method shows limited gain and phase stability margins. In this paper an active damping technique employing a virtual negative inductance for the CSI is proposed. The introduction of a virtual negative inductance around the resonance frequency causes active frequency shifting. The advantages of the proposed system are better time response and increased stability margins. Simulation results for a grid connected CSI have been presented to substantiate the proposed technique.

Original languageEnglish
Title of host publicationAPEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition
Pages63-67
Number of pages5
DOIs
Publication statusPublished - 2010
Event25th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2010 - Palm Springs, CA, United States
Duration: 21 Feb 201025 Feb 2010

Other

Other25th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2010
CountryUnited States
CityPalm Springs, CA
Period21/2/1025/2/10

    Fingerprint

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Morsy, A. S., Ahmed, S., Enjeti, P., & Massoud, A. (2010). An active damping technique for a current source inverter employing a virtual negative inductance. In APEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition (pp. 63-67). [5433694] https://doi.org/10.1109/APEC.2010.5433694