A unique active anti-islanding protection for a quasi-Z-Source based Power Conditioning System

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Citations (Scopus)

Abstract

This paper presents the performance assessment of three active Islanding Detection Methods (IDMs) for a quasi-Z-Source (qZS) based Power Conditioning System (PCS). The proposed PCS consists of a three-cell Cascaded H-Bridge (CHB) inverter where each module is fed by a qZS network. The proposed combined controller achieves grid-tie current injection, DC-link voltage balance for all qZS-CHB inverter modules, and anti-islanding protection. The anti-islanding protection performance is evaluated for three phase-shift based active Islanding Detection Methods (IDMs), namely Active Frequency Drift (AFD), Slide-Mode Frequency Shift (SMS), and Sandia Frequency Shift (SFS). Simulation results and real-time implementation using dS1103 board are carried out to validate the proposed design.

Original languageEnglish
Title of host publicationAPEC 2015 - 30th Annual IEEE Applied Power Electronics Conference and Exposition
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2237-2243
Number of pages7
Volume2015-May
EditionMay
DOIs
Publication statusPublished - 8 May 2015
Event30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015 - Charlotte, United States
Duration: 15 Mar 201519 Mar 2015

Other

Other30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015
CountryUnited States
CityCharlotte
Period15/3/1519/3/15

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Keywords

  • Anti-islanding protection
  • Grid interfacing
  • Multilevel inverter
  • Power conditioning system
  • Quasi-Z-source network

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Trabelsi, M., & Abu-Rub, H. (2015). A unique active anti-islanding protection for a quasi-Z-Source based Power Conditioning System. In APEC 2015 - 30th Annual IEEE Applied Power Electronics Conference and Exposition (May ed., Vol. 2015-May, pp. 2237-2243). [7104660] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APEC.2015.7104660