A system level solution for power electronic measurements

Shehab Ahmed, Masoud Haji, Hamid A. Toliyat

Research output: Contribution to journalConference article

Abstract

With the increased use of digital instrumentation in industrial applications, it becomes highly essential for the engineer to become more familiar and aware of the possible sources of measurement error related to the instruments being used and their internal construction. This paper will aim at providing a common terminology, and error quantification in such systems. The discussion is aimed at both the user and the manufacturer of such instruments. The main body presents many performance features of modern digital measurement systems and the sources of error. Simple MATLAB/SIMULINK models will attempt to simulate digital measurement system components in an intuitive manner. Developing such an understanding will aid in the determination of the required tests and the interpretation of their results. The work is aimed at a better understanding of the non-sinusoidal situation and the measuring problems due to non-sinusoidal conditions. The main part of this work is the development of a solid background using modern simulation tools of one of the main components of the measurement system, namely the data converter, and its requirements and errors. Sample data converter specifications will be illustrated based on a sample nonlinear inverter waveform analysis. A new simple low cost topology for a data converter suitable for such an application is also presented and its performance is assessed using simulation. At the end a comparison between this method and the existing one in TI DSP TMS2407 is made.

Original languageEnglish
Pages (from-to)307-311
Number of pages5
JournalConference Record - IAS Annual Meeting (IEEE Industry Applications Society)
Volume1
Publication statusPublished - 1 Jan 2002
Event37th IAS Annual Meeting and World Conference on Industrial applications of Electrical Energy - Pittsburgh, PA, United States
Duration: 13 Oct 200218 Oct 2002

    Fingerprint

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this