A scanned-angle and scanned-energy photoelectron diffraction study of ( 3 × 3)R30° Ag on Si(111)

G. S. Herman, E. L. Bullock, M. Yamada, A. P. Kaduwela, D. J. Friedman, S. Thevuthasan, Y. J. Kim, T. T. Tran, C. S. Fadley, Th Lindner, D. E. Ricken, A. W. Robinson, A. M. Bradshaw

Research output: Contribution to journalArticle

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Abstract

Photoelectron diffraction data for Ag3d emission from ( 3 × 3R30° Ag on Si(111) have been obtained in all three possible modes: scanned polar angle, scanned azimuthal angle, and scanned energy. Single and multiple scattering cluster calculations with spherical-wave scattering have been carried out for a wide range of structural models and compared to experiment using R factors. In addition, scanned-angle photoelectron diffraction data for the substrate Si 2p intensities have been obtained over essentially the full solid angle above both the clean and Ag-covered surfaces. These data and their analysis indicate that the Ag cannot be more than 0.5 Å below the topmost layer of atoms in the structure, and that the most likely models for the geometry among the many proposed are the honeycomb-chained-trimer and the two-domain missing-top-layer Ag honeycomb. We also suggest that these two models may coexist and interconvert between one another with subtle changes in the local Ag coverage between 2 3 and 1 ML.

Original languageEnglish
Pages (from-to)23-52
Number of pages30
JournalSurface Science
Volume284
Issue number1-2
DOIs
Publication statusPublished - 10 Mar 1993
Externally publishedYes

Fingerprint

Photoelectrons
photoelectrons
Diffraction
diffraction
R Factors
Multiple scattering
spherical waves
energy
wave scattering
trimers
Scattering
Atoms
Geometry
Substrates
geometry
Experiments
scattering
atoms

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Herman, G. S., Bullock, E. L., Yamada, M., Kaduwela, A. P., Friedman, D. J., Thevuthasan, S., ... Bradshaw, A. M. (1993). A scanned-angle and scanned-energy photoelectron diffraction study of ( 3 × 3)R30° Ag on Si(111). Surface Science, 284(1-2), 23-52. https://doi.org/10.1016/0039-6028(93)90523-M

A scanned-angle and scanned-energy photoelectron diffraction study of ( 3 × 3)R30° Ag on Si(111). / Herman, G. S.; Bullock, E. L.; Yamada, M.; Kaduwela, A. P.; Friedman, D. J.; Thevuthasan, S.; Kim, Y. J.; Tran, T. T.; Fadley, C. S.; Lindner, Th; Ricken, D. E.; Robinson, A. W.; Bradshaw, A. M.

In: Surface Science, Vol. 284, No. 1-2, 10.03.1993, p. 23-52.

Research output: Contribution to journalArticle

Herman, GS, Bullock, EL, Yamada, M, Kaduwela, AP, Friedman, DJ, Thevuthasan, S, Kim, YJ, Tran, TT, Fadley, CS, Lindner, T, Ricken, DE, Robinson, AW & Bradshaw, AM 1993, 'A scanned-angle and scanned-energy photoelectron diffraction study of ( 3 × 3)R30° Ag on Si(111)', Surface Science, vol. 284, no. 1-2, pp. 23-52. https://doi.org/10.1016/0039-6028(93)90523-M
Herman GS, Bullock EL, Yamada M, Kaduwela AP, Friedman DJ, Thevuthasan S et al. A scanned-angle and scanned-energy photoelectron diffraction study of ( 3 × 3)R30° Ag on Si(111). Surface Science. 1993 Mar 10;284(1-2):23-52. https://doi.org/10.1016/0039-6028(93)90523-M
Herman, G. S. ; Bullock, E. L. ; Yamada, M. ; Kaduwela, A. P. ; Friedman, D. J. ; Thevuthasan, S. ; Kim, Y. J. ; Tran, T. T. ; Fadley, C. S. ; Lindner, Th ; Ricken, D. E. ; Robinson, A. W. ; Bradshaw, A. M. / A scanned-angle and scanned-energy photoelectron diffraction study of ( 3 × 3)R30° Ag on Si(111). In: Surface Science. 1993 ; Vol. 284, No. 1-2. pp. 23-52.
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AU - Kaduwela, A. P.

AU - Friedman, D. J.

AU - Thevuthasan, S.

AU - Kim, Y. J.

AU - Tran, T. T.

AU - Fadley, C. S.

AU - Lindner, Th

AU - Ricken, D. E.

AU - Robinson, A. W.

AU - Bradshaw, A. M.

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AB - Photoelectron diffraction data for Ag3d emission from ( 3 × 3R30° Ag on Si(111) have been obtained in all three possible modes: scanned polar angle, scanned azimuthal angle, and scanned energy. Single and multiple scattering cluster calculations with spherical-wave scattering have been carried out for a wide range of structural models and compared to experiment using R factors. In addition, scanned-angle photoelectron diffraction data for the substrate Si 2p intensities have been obtained over essentially the full solid angle above both the clean and Ag-covered surfaces. These data and their analysis indicate that the Ag cannot be more than 0.5 Å below the topmost layer of atoms in the structure, and that the most likely models for the geometry among the many proposed are the honeycomb-chained-trimer and the two-domain missing-top-layer Ag honeycomb. We also suggest that these two models may coexist and interconvert between one another with subtle changes in the local Ag coverage between 2 3 and 1 ML.

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