A Poltyrev outage limit for lattices

Mayur Punekar, Joseph Boutros, Ezio Biglieri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Nonergodic fading is a useful model for various wireless communication channels in both indoor and outdoor environments. With this model, a codeword is divided into multiple blocks such that fading is constant within a block and independent across blocks. Building on Poltyrev's work on infinite lattice constellations for the Gaussian channel, we derive a Poltyrev outage limit for lattice constellations transmitted over a block-faded channel. We prove that the diversity order of this Poltyrev outage limit is equal to the number of degrees of freedom in the channel. An important application is in decoding low-density lattice codes. With block fading, the presence of an outage may dramatically increase the runtime of both sphere and iterative decoders. Using our newly defined Poltyrev outage limit, decoding is not performed whenever an outage is declared, which drastically reduces the overall decoding time.

Original languageEnglish
Title of host publicationProceedings - 2015 IEEE International Symposium on Information Theory, ISIT 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages456-460
Number of pages5
Volume2015-June
ISBN (Electronic)9781467377041
DOIs
Publication statusPublished - 28 Sep 2015
EventIEEE International Symposium on Information Theory, ISIT 2015 - Hong Kong, Hong Kong
Duration: 14 Jun 201519 Jun 2015

Other

OtherIEEE International Symposium on Information Theory, ISIT 2015
CountryHong Kong
CityHong Kong
Period14/6/1519/6/15

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ASJC Scopus subject areas

  • Theoretical Computer Science
  • Information Systems
  • Modelling and Simulation
  • Applied Mathematics

Cite this

Punekar, M., Boutros, J., & Biglieri, E. (2015). A Poltyrev outage limit for lattices. In Proceedings - 2015 IEEE International Symposium on Information Theory, ISIT 2015 (Vol. 2015-June, pp. 456-460). [7282496] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIT.2015.7282496