A hybrid CMOS DPS with conditional data readout scheme

Ka Lai Lau, Sylvain Léomant, Amine Bermak

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, a hybrid CMOS pulse width modulation (PWM) digital pixel sensor (DPS) is proposed. In order to reduce the pixel area, the proposed architecture requires only a two bit on-pixel memory while placing the remaining six bits outside the array, assuming a common resolution of eight bits. This new architecture reduces the size of the pixel significantly as the memory requirement at pixel level is divided by 4. The eight bit resolution is maintained by scanning the array of pixels periodically during the integration period. In addition, a conditional data readout scheme is proposed in order to reduce the unnecessary read operations of pixel-level memories. Therefore, switching activity of data buses and dynamic power are kept under control. In our implementation, the pixel contains only 21 transistors and occupies an area of about 9μm × 9μm, with a fill factor of 12% using a 0.18μm CMOS process. Simulation results show a 50% reduction of read bit-lines switching activity at low illumination conditions, using our conditional readout scheme.

Original languageEnglish
Title of host publicationProceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
Pages44-47
Number of pages4
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 - Ho Chi Minh City, Viet Nam
Duration: 13 Jan 201015 Jan 2010

Other

Other5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
CountryViet Nam
CityHo Chi Minh City
Period13/1/1015/1/10

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Keywords

  • Conditional readout
  • DPS
  • PWM

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Lau, K. L., Léomant, S., & Bermak, A. (2010). A hybrid CMOS DPS with conditional data readout scheme. In Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 (pp. 44-47). [5438713] https://doi.org/10.1109/DELTA.2010.64