A critical study of defect migration and ferroelectric fatigue in lead zirconate titanate thin film capacitors under extreme temperatures

Eric Paton, Mark Brazier, Said Mansour, Arden Bement

Research output: Chapter in Book/Report/Conference proceedingChapter

26 Citations (Scopus)

Abstract

The temperature dependence of the ferroelectric switching behavior was measured for lead zirconate titanate capacitors with the composition Pb(Zr .60Ti .40)O 3. Results indicated that a temperature rise contributes to an increasing rate of logarithmic decay in the polarization during repeated switching reversals. Most current theories dealing with polarization degradation, known as fatigue, are based on the motion of defects. In support of this phenomena, where the decay rate R(T) is proportional to exp(ΔQ/kT), two quantitative models are developed used to measure the thermally activated fatigue process. Fatigue curves of polarization versus number of cycles reveal that extremes in temperature are necessary to distinguish changes in the rate of fatigue, translating to a very small measured activation energy of approximately 0.05 eV. This small value leads one to believe that the mechanism responsible deals with the transport of electrons/holes, not ionic defects, Caution must be taken in this conclusion since the measured value is only the thermal component for the activation energy, and does not account for a work term.

Original languageEnglish
Title of host publicationIntegrated Ferroelectrics
Pages29-37
Number of pages9
Volume18
Edition1-4
Publication statusPublished - 1998
Externally publishedYes

Fingerprint

Ferroelectric materials
capacitors
Fatigue of materials
Defects
defects
polarization
Polarization
thin films
activation energy
translating
Activation energy
Temperature
decay rates
temperature
degradation
temperature dependence
cycles
Capacitors
decay
curves

Keywords

  • Activation energy
  • Capacitors
  • Fatigue
  • Ferroelectric
  • PZT
  • Temperature
  • Thin Film

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics

Cite this

Paton, E., Brazier, M., Mansour, S., & Bement, A. (1998). A critical study of defect migration and ferroelectric fatigue in lead zirconate titanate thin film capacitors under extreme temperatures. In Integrated Ferroelectrics (1-4 ed., Vol. 18, pp. 29-37)

A critical study of defect migration and ferroelectric fatigue in lead zirconate titanate thin film capacitors under extreme temperatures. / Paton, Eric; Brazier, Mark; Mansour, Said; Bement, Arden.

Integrated Ferroelectrics. Vol. 18 1-4. ed. 1998. p. 29-37.

Research output: Chapter in Book/Report/Conference proceedingChapter

Paton, Eric ; Brazier, Mark ; Mansour, Said ; Bement, Arden. / A critical study of defect migration and ferroelectric fatigue in lead zirconate titanate thin film capacitors under extreme temperatures. Integrated Ferroelectrics. Vol. 18 1-4. ed. 1998. pp. 29-37
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