A 2PJ/Pixel/Direction MIMO Processing Based CMOS Image Sensor for Omnidirectional Local Binary Pattern Extraction and Edge Detection

Xiaopeng Zhong, Qian Yu, Amine Bermak, Chi Ying Tsui, May Kay Law

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper presents an energy-efficient multi-mode CMOS image sensor featuring omnidirectional local binary pattern extraction (LBP-E), edge detection (ED) and normal imaging. A mixed-signal 4-pixel simultaneous group computation (GC) scheme is developed to extract complete 8-direction LBP and edge. High-speed and energy-efficient column-parallel GC is achieved with the proposed group-switchable multi-input multi-output (MIMO) comparator. The reconfigurable mixed-signal processing circuits ensure multi-mode operations with minimum area overhead. Fabricated in 0.18μ m CMOS, the prototype sensor consumes 6.5μ W and 12.7μ W at 30fps for full 8-direction LBP-E and ED, achieving the state-of-the-art FoMs of 2.0 and 3.9 pJ/pixel/direction, respectively. Measurement results also demonstrate high-accuracy on-chip LBP-E, with a histogram similarity of up to 97.5% compared to the DSP one.

Original languageEnglish
Title of host publication2018 IEEE Symposium on VLSI Circuits, VLSI Circuits 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages247-248
Number of pages2
Volume2018-June
ISBN (Electronic)9781538667002
DOIs
Publication statusPublished - 22 Oct 2018
Event32nd IEEE Symposium on VLSI Circuits, VLSI Circuits 2018 - Honolulu, United States
Duration: 18 Jun 201822 Jun 2018

Other

Other32nd IEEE Symposium on VLSI Circuits, VLSI Circuits 2018
CountryUnited States
CityHonolulu
Period18/6/1822/6/18

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Zhong, X., Yu, Q., Bermak, A., Tsui, C. Y., & Law, M. K. (2018). A 2PJ/Pixel/Direction MIMO Processing Based CMOS Image Sensor for Omnidirectional Local Binary Pattern Extraction and Edge Detection. In 2018 IEEE Symposium on VLSI Circuits, VLSI Circuits 2018 (Vol. 2018-June, pp. 247-248). [8502214] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VLSIC.2018.8502214